• DocumentCode
    237058
  • Title

    Enhanced estimates of field distribution´s uncertainty contribution for TEM waveguides

  • Author

    Hamann, David ; Garbe, Heyno

  • Author_Institution
    Inst. of Electr. Eng. & Meas. Technol., Leibniz Univ. Hannover, Hannover, Germany
  • fYear
    2014
  • fDate
    4-8 Aug. 2014
  • Firstpage
    899
  • Lastpage
    902
  • Abstract
    The expanded measurement uncertainty of both the measurement of radiated emission and the measurement of electromagnetic field immunity depends mostly on the field distribution within the testing volume. In general, that uncertainty contribution has to be estimated from sampled measurement data. In most cases this results in an overestimation. The estimate can be reduced by exact knowledge of the field distribution and extensive measurements. In this paper a method is described, that calculates enhanced estimates from the calibration data of the test method. This calibration data has to be measured for the validation of the test volume and thus there is no need to perform another extensive measurement to calculate the uncertainty contribution. The enhanced estimate is obtained from the combination of analytical knowledge of the theoretical field distribution, measurement data and stochastical methods. The theory explained in this paper is applied to the calibration data of a GTEM 1250. It is shown, that the estimates are in good agreement with uncertainty contributions obtained from more extensive measurements.
  • Keywords
    calibration; measurement uncertainty; stochastic processes; waveguides; GTEM 1250; TEM waveguides; calibration data; enhanced estimate; field distribution; measurement uncertainty; stochastical methods; Calibration; Electromagnetic waveguides; Equations; Mathematical model; Measurement uncertainty; Standards; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
  • Conference_Location
    Raleigh, NC
  • Print_ISBN
    978-1-4799-5544-2
  • Type

    conf

  • DOI
    10.1109/ISEMC.2014.6899095
  • Filename
    6899095