DocumentCode
237058
Title
Enhanced estimates of field distribution´s uncertainty contribution for TEM waveguides
Author
Hamann, David ; Garbe, Heyno
Author_Institution
Inst. of Electr. Eng. & Meas. Technol., Leibniz Univ. Hannover, Hannover, Germany
fYear
2014
fDate
4-8 Aug. 2014
Firstpage
899
Lastpage
902
Abstract
The expanded measurement uncertainty of both the measurement of radiated emission and the measurement of electromagnetic field immunity depends mostly on the field distribution within the testing volume. In general, that uncertainty contribution has to be estimated from sampled measurement data. In most cases this results in an overestimation. The estimate can be reduced by exact knowledge of the field distribution and extensive measurements. In this paper a method is described, that calculates enhanced estimates from the calibration data of the test method. This calibration data has to be measured for the validation of the test volume and thus there is no need to perform another extensive measurement to calculate the uncertainty contribution. The enhanced estimate is obtained from the combination of analytical knowledge of the theoretical field distribution, measurement data and stochastical methods. The theory explained in this paper is applied to the calibration data of a GTEM 1250. It is shown, that the estimates are in good agreement with uncertainty contributions obtained from more extensive measurements.
Keywords
calibration; measurement uncertainty; stochastic processes; waveguides; GTEM 1250; TEM waveguides; calibration data; enhanced estimate; field distribution; measurement uncertainty; stochastical methods; Calibration; Electromagnetic waveguides; Equations; Mathematical model; Measurement uncertainty; Standards; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location
Raleigh, NC
Print_ISBN
978-1-4799-5544-2
Type
conf
DOI
10.1109/ISEMC.2014.6899095
Filename
6899095
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