• DocumentCode
    2371447
  • Title

    Boolean process-an analytical approach to circuit representation

  • Author

    Min, Yinghua

  • Author_Institution
    Inst. of Comput. Technol., Acad. Sinica, Beijing, China
  • fYear
    1994
  • fDate
    15-17 Nov 1994
  • Firstpage
    249
  • Lastpage
    254
  • Abstract
    One of the most important and challenging problems in today´s VLSI design is that of incorporating performance factors in the physical and logical design of VLSI circuits. In order to precisely describe circuit timing behavior, an analytical approach is introduced in this paper. A Boolean process is defined, which is a family of Boolean variables relevant to the time parameter t. A real-valued sample of a Boolean process is a waveform. Any waveform is an expression of a basic waveform. The edge sequence of a waveform is represented by a ladder function. This analytical approach enables us to describe the circuit timing behavior in an accurate way, and is applicable to IC design and test. Interestingly, it is suggested that a test pair with multiple transition might be efficient for delay testing if the initial delay can be controlled
  • Keywords
    Boolean algebra; VLSI; circuit CAD; delays; integrated circuit design; integrated logic circuits; logic design; Boolean process; Boolean variables; IC design; VLSI circuits; VLSI design; circuit representation; circuit timing behavior; delay control; delay testing; edge sequence; ladder function; logical design; multiple transition; performance factors; test pair; timing behavior; waveform functions; Boolean algebra; Circuit analysis; Circuit synthesis; Circuit testing; Clocks; Delay; Hardware; Logic; Timing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1994., Proceedings of the Third Asian
  • Conference_Location
    Nara
  • Print_ISBN
    0-8186-6690-0
  • Type

    conf

  • DOI
    10.1109/ATS.1994.367223
  • Filename
    367223