Characterization of Coaxial Adapters for S-parameter Measurements

Author

Hoffmann, Johannes Paul ; Leuchtman, Pascal ; Kretz, Adjan ; Rüfenacht, Jürg ; Vahldieck, Rüdiger

Author_Institution

IFH, ETH Zurich, Zurich

fYear

2008

fDate

27-31 Oct. 2008

Firstpage

313

Lastpage

316

Abstract

The accuracy of S-parameter measurements can be improved by replacing calibration kits for industry grade connectors by a combination of one calibration kit for metrology grade connectors and well characterized adapters. This paper compares two methods to characterize such adapters which join metrology grade coaxial connectors with industry grade connectors. A first method employs a thru connection as well as opens and shorts with industry grade interfaces to obtain the full S-parameters of an adapter. The second method uses beadless adapters rather than opens and shorts. It is shown that the second method is superior in particular for frequencies above 30 GHz.

Keywords

S-parameters; calibration; coaxial cables; electric connectors; S-parameter measurements; beadless adapters; calibration kit; coaxial adapters; coaxial connectors; industry grade connectors; metrology grade connectors; thru connection; Bandwidth; Calibration; Coaxial components; Connectors; Frequency; Metrology; Microwave measurements; Scattering parameters; Testing; Uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2008. EuMC 2008. 38th European

Conference_Location

Amsterdam

Print_ISBN

978-2-87487-006-4

Type

conf

DOI

10.1109/EUMC.2008.4751451

Filename

4751451