DocumentCode
2371813
Title
Sequential test generation in massive observability environments
Author
Varma, Prab
Author_Institution
CrossCheck Technol. Inc., San Jose, CA, USA
fYear
1994
fDate
15-17 Nov 1994
Firstpage
119
Lastpage
124
Abstract
This paper describes a sequential test generation method for circuits in massive observability environments such as those offered by quiescent current monitoring and gate arrays with embedded test points. Techniques to enhance the controllability of the circuit are also discussed and an algorithm for selecting storage elements to make accessible during the test mode is proposed
Keywords
automatic programming; automatic testing; controllability; fault diagnosis; logic testing; observability; sequential circuits; ATPG; CrossCheck; IDDQ testing; controllability; embedded test points; gate arrays; massive observability environments; quiescent current monitoring; sequential test generation; storage elements; Automatic test pattern generation; Circuit faults; Circuit testing; Mesh generation; Monitoring; Observability; Sequential analysis; Sequential circuits; Switches; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location
Nara
Print_ISBN
0-8186-6690-0
Type
conf
DOI
10.1109/ATS.1994.367243
Filename
367243
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