DocumentCode
2372334
Title
High-Efficiency Class-E-Cells-Based GaN HEMT Doherty Amplifier for WCDMA Applications
Author
Lee, Yong-Sub ; Lee, Mun-Woo ; Jeong, Yoon-Ha
Author_Institution
Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., Pohang
fYear
2008
fDate
27-31 Oct. 2008
Firstpage
428
Lastpage
431
Abstract
This paper represents a high-efficiency GaN high electron mobility transistor (HEMT) class-E Doherty amplifier (CEDA) for wide-band code division multiple access (WCDMA) applications. The class-E power amplifiers (PAs) with significant harmonic suppression are used as the carrier and peaking cells. To further improve the efficiency, the asymmetrical drain biases are applied to the CEDA. For validations, the class-E PA is designed and implemented with 25-W GaN HEMT at 2.14 GHz. From the measured results for a single tone, the peak power-added efficiency (PAE) and drain efficiency of 73.5% and 76.5% are achieved with a gain of 14.1 dB at an output power of 43.1 dBm by suppressing harmonic power levels below -60 dBc. For the proposed CEDA, the PAE and drain efficiency of 56.1% and 61.2% is achieved at 40 dBm (6-dB back-off power from Psat) for a single tone. For a 1-carrier WCDMA signal, the PAE of 57.2% is obtained with an adjacent channel leakage ratio (ACLR) of -27.2 dBc at 40 dBm, which is 9.6% improvement over the conventional Doherty amplifier with an ACLR of -29.5 dBc.
Keywords
HEMT circuits; III-V semiconductors; UHF power amplifiers; code division multiple access; gallium compounds; microwave power amplifiers; Doherty amplifier; GaN; channel leakage ratio; drain efficiency; high-efficiency class-E-cells-based GaN HEMT; power- added efficiency; power-added efficiency; wide-band code division multiple access; Broadband amplifiers; Gain measurement; Gallium nitride; HEMTs; Harmonics suppression; MODFETs; Multiaccess communication; Power amplifiers; Power generation; Power measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2008. EuMC 2008. 38th European
Conference_Location
Amsterdam
Print_ISBN
978-2-87487-006-4
Type
conf
DOI
10.1109/EUMC.2008.4751480
Filename
4751480
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