• DocumentCode
    2372491
  • Title

    Effect of insulating barriers in arc flash testing

  • Author

    Wilkins, Robert ; Lang, Mike ; Allison, Malcolm

  • Author_Institution
    Overdee, Heswall
  • fYear
    2008
  • fDate
    22-27 June 2008
  • Firstpage
    120
  • Lastpage
    125
  • Abstract
    Low voltage arc flash testing has been conducted using the standard IEEE1584 test procedure, but with the electrode tips terminated in an insulating barrier instead of in the open air. The barrier prevents downwards arc motion, has a stabilizing effect on the arcs, and produces a strong horizontal plasma cloud flow. It also produces shorter arc lengths, higher arcing currents and higher maximum incident energy density, when compared with the standard arrangement. Erosion of the copper electrodes is very high and this causes a much larger quantity of copper spray to be directed towards the outside of the box. Similar results can be observed when vertical conductors are terminated in real industrial components. The effect of the barrier and the source X/R on arc sustainability at 208V has also been studied. The barrier test arrangement is believed to be more representative of real-world equipment. It is proposed that an arrangement like this should be incorporated into future revisions of the IEEE 1584 testing standard.
  • Keywords
    IEEE standards; arcs (electric); electrical safety; erosion; hazards; IEEE1584 test procedure; arc flash hazard testing; barrier test arrangement; insulating barriers; plasma cloud flow; voltage 208 V; Clouds; Conductors; Copper; Electrodes; Insulation; Low voltage; Magnetic forces; Materials testing; Plasma density; USA Councils; Arc flash hazard testing; arcing fault sustainability; effect of X/R; effect of insulating barriers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulp and Paper Industry Technical Conference, 2008. PPIC 2008. Conference Record of 2008 54th Annual
  • Conference_Location
    Seattle, WA
  • ISSN
    0190-2172
  • Print_ISBN
    978-1-4244-2524-2
  • Electronic_ISBN
    0190-2172
  • Type

    conf

  • DOI
    10.1109/PAPCON.2008.4585811
  • Filename
    4585811