Probes for a scanning near-field optical microscope on the base tapered single-mode optical fiber

Author

Dryakhlushin, V.F. ; Klimov, A. Yu ; Rogov, V.V.

Author_Institution

Inst. for Phys. of Microstructure, Russian Acad. of Sci., Novgorod

Volume

2

fYear

2003

fDate

16-20 Sept. 2003

Firstpage

36

Abstract

Probes for a scanning near-field optical microscope on the base a single-mode adiabatically tapered optical fiber have been fabricated by the chemical etching only. The transmission coefficient of light in this probes is 2-3 order magnitude higher than that of mechanical pulled fibres probes. The probes may be used for green (lambda=0.48-0.55 mum), red (0.60-0.68 mum) and near infrared (0.78-1.05 mum) wavelength ranges the reason of this effect is explained. Probe of the scanning near-field optical microscope on the base microstrip line is proposed

Keywords

etching; microstrip lines; near-field scanning optical microscopy; optical fibre fabrication; scanning electron microscopy; 0.48 to 0.55 micron; 0.60 to 0.68 micron; 0.78 to 1.05 micron; chemical etching; mechanical pulled fibre probe; microstrip line; near infrared; scanning near-field optical microscope; single-mode adiabatically tapered optical fiber; Biomedical optical imaging; Chemicals; Etching; Optical fiber devices; Optical fibers; Optical films; Optical microscopy; Optical recording; Optical waveguides; Probes;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Optoelectronics and Lasers, 2003. Proceedings of CAOL 2003. First International Conference on

Conference_Location

Alushta, Crimea

Print_ISBN

0-7803-7948-9

Type

conf

DOI

10.1109/CAOL.2003.1251256

Filename

1251256