DocumentCode
2374477
Title
Forced vibrations of KT-cut width-extensional mode quartz crystal resonators
Author
Kawashima, Hitoshi
Author_Institution
Seiko Electron. Components Co., Ltd., Tochigi-shi
fYear
1993
fDate
2-4 Jun 1993
Firstpage
527
Lastpage
534
Abstract
The author describes an analysis of forced vibrations for KT-cut width-extensional mode quartz crystal resonators with a zero temperature coefficient at room temperature and an absolute value of its second order temperature coefficient β smaller than that of the DT-cut. The objectives are to clarify the influence on frequency temperature behavior of a piezoelectric term and errors of temperature coefficients of elastic stiffness constants and the piezoelectric term used in the calculation. A frequency equation and a transcendental equation are derived including a piezoelectric term, i.e., the frequency equation is given as a one-dimensional-approximate equation. The frequency constant and temperature coefficients of α, β, and γ are calculated from the frequency equation. The calculated values of frequency temperature behavior were compared with the measured ones for a WE resonator with frequencies of fs = 13.6, 16.3, and 30.7 MHz, when the error of temperature coefficients for the elastic stiffness constants and the piezoelectric term used in this calculation was taken onto account
Keywords
crystal resonators; elastic constants; piezoelectric oscillations; quartz; vibrations; 13.6 MHz; 16.3 MHz; 30.7 MHz; KT-cut width-extensional mode quartz crystal resonators; SiO2; elastic stiffness constants; forced vibrations; frequency constant; frequency equation; frequency temperature behavior; one-dimensional-approximate equation; piezoelectric term; second order temperature coefficient; transcendental equation; zero temperature coefficient; Coordinate measuring machines; Dentistry; Electronic components; Equations; Frequency measurement; Resonant frequency; Stress; Tellurium; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International
Conference_Location
Salt Lake City, UT
Print_ISBN
0-7803-0905-7
Type
conf
DOI
10.1109/FREQ.1993.367440
Filename
367440
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