• DocumentCode
    2374684
  • Title

    Accuracy Improvement of Cavity Model Effective Patch Dimensions using a Single Full-Wave Iteration

  • Author

    Theeuwes, Jeroen A C ; Visser, Huib J. ; van Beurden, Martijn C. ; Doodeman, Gert J N

  • Author_Institution
    TNO Sci. & Ind., Eindhoven
  • fYear
    2008
  • fDate
    27-31 Oct. 2008
  • Firstpage
    928
  • Lastpage
    931
  • Abstract
    An accuracy improvement procedure for microstrip patch antenna design is presented. The classical cavity model of a patch antenna is discussed with emphasis on the fringe fields and the compensation for these fringe fields in the form of effective patch dimensions. The effective patch dimensions are improved using a single full-wave simulation, drastically increasing accuracy at the cost of only a small increase in computation time. Using the input impedance of the patch antenna determined via a full-wave simulator, effective patch dimensions are adjusted for each single mode, matching the cavity model results to the full-wave results. It is found that adjustment of non-resonant modes cause a shift in amplitude of the input impedance and a adjustment of a resonant mode results in a shift in frequency. The error in predicted impedance decreases from 75% to 5%. An example is given where an exotic input impedance is required, to match the antenna directly to a nonlinear system. This shows that this method results in fast, efficient, reliable and optimal microstrip patch antenna design.
  • Keywords
    antenna theory; electric impedance; microstrip antennas; cavity model; effective patch dimensions; error; input impedance; microstrip patch antenna design; non-resonant modes; resonant mode; single full-wave simulation; Computational modeling; Costs; Etching; Feeds; Impedance; Manufacturing processes; Microstrip antennas; Patch antennas; Rectennas; Rectifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2008. EuMC 2008. 38th European
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-2-87487-006-4
  • Type

    conf

  • DOI
    10.1109/EUMC.2008.4751606
  • Filename
    4751606