• DocumentCode
    2376577
  • Title

    Leadframe designs for minimum molding-induced warpage

  • Author

    Nguyen, L.T. ; Chen, K.L. ; Lee, P.

  • Author_Institution
    Nat. Semicond. Corp., Santa Clara, CA, USA
  • fYear
    1994
  • fDate
    1-4 May 1994
  • Firstpage
    513
  • Lastpage
    520
  • Abstract
    The current packaging trend toward thinner packages has pushed the leadframe manufacturing technology to the limits. For instance, with Ultra Thin Small Outline Packages (UTSOPs), the total form factor is less than 0.5 mm thick, which is about twice the thickness of the typical leadframe used in current standard IC packages. Thus, the leadframe must be scaled down appropriately with the rest of the package components. The thinner leadframe stock brings a host of handling difficulties. Most important of all is the bending and twisting of the leadframes caused by molding induced stresses. The resulting deformation affects the subsequent post-molding steps such as trim and form, and may seriously increase the production yield loss due to lead non-coplanarity. This study addresses the manufacturing and design issues involved with minimizing these molding-induced stresses. Through a combination of good control on the process parameters (e.g., post-molding handling, cooling, deflash procedures, etc.) and leadframe designs (e.g., package relative positioning within the leadframe strips, relief holes and slots, strengthened support strips, etc.), leadframe warpage from thermomechanical stresses can be reduced. Warpage predictions from finite element simulation will be presented for various leadframe designs in this paper
  • Keywords
    bending; finite element analysis; integrated circuit packaging; 0.5 mm; IC packages; Ultra Thin Small Outline Packages; bending; deformation; finite element simulation; form; form factor; lead noncoplanarity; leadframe designs; leadframe manufacturing; molding-induced warpage; packaging; process parameters; production yield loss; stresses; thermomechanical stresses; trim; twisting; Cooling; Integrated circuit packaging; Manufacturing; Process control; Production; Stress control; Strips; Temperature control; Thermal stresses; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1994. Proceedings., 44th
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-0914-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1994.367545
  • Filename
    367545