• DocumentCode
    2377284
  • Title

    Multiple-Throw Millimeter-Wave FET Switches for Frequencies from 60 up to 120 GHz

  • Author

    Kallfass, I. ; Diebold, S. ; Massler, H. ; Koch, S. ; Seelmann-Eggebert, M. ; Leuther, A.

  • Author_Institution
    Fraunhofer Inst. for Appl. Solid-State Phys., Freiburg
  • fYear
    2008
  • fDate
    27-31 Oct. 2008
  • Firstpage
    1453
  • Lastpage
    1456
  • Abstract
    This paper presents the design and performance of various millimeter-wave FET switches realized in a metamorphic HEMT technology. The single-pole multi-throw switch configurations are targeting wireless communication frontends and imaging radiometers at 60, 94 and 120 GHz. In SPDT switches, state-of-the-art insertion loss of 1.4 and 1.8 dB is achieved at 60 and 94 GHz, respectively. Rivalled only by PIN diode swithces, an insertion loss of Lt2 dB is demonstrated up to 120 GHz. Shorted stubs are used to compensate for parasitic FET capacitance and allow for matching. Linearity data is presented for 60 and 94 GHz SPDT switches. A comprehensive comparison with state-of-the-art planar SPDT switches is included. A 2:6 switch network for multi-antenna transceivers achieves Lt4 dB insertion loss at 60 GHz.
  • Keywords
    high electron mobility transistors; semiconductor switches; frequency 120 GHz; frequency 60 GHz; frequency 94 GHz; high electron mobility transistors; imaging radiometers; insertion loss; loss 1.4 dB; loss 1.8 dB; metamorphic HEMT technology; multi-antenna transceivers; multiple-throw millimeter-wave FET switches; planar SPDT switches; single-pole multi-throw switch configurations; switch network; wireless communication frontends; Communication switching; FETs; Frequency; Insertion loss; Millimeter wave communication; Millimeter wave technology; Radiometers; Switches; Wireless communication; mHEMTs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2008. EuMC 2008. 38th European
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-2-87487-006-4
  • Type

    conf

  • DOI
    10.1109/EUMC.2008.4751740
  • Filename
    4751740