Application of high-quality built-in test to industrial designs

Author

Hatayama, Kazumi ; Nakao, Michinobu ; Kiyoshige, Yoshikazu ; Natsume, Koichiro ; Sato, Yasuo ; Nagumo, Takaharu

Author_Institution

Central Res. Lab., Hitachi Ltd., Kokubunji, Japan

fYear

2002

fDate

2002

Firstpage

1003

Lastpage

1012

Abstract

This paper presents an approach for high-quality built-in test using a neighborhood pattern generator (NPG). The proposed NPG is practically acceptable because (a) its structure is independent of circuit under test, (b) it requires low area overhead and no performance degradation, and (c) it can encode deterministic test cubes, not only for stuck-at faults but also transition faults, with high probability. Experimental results for large industrial circuits illustrate the efficiency of the proposed approach.

Keywords

automatic test pattern generation; built-in self test; fault diagnosis; integrated circuit manufacture; integrated circuit testing; logic testing; production testing; BIST; NPG; area overhead; circuit under test; deterministic test cubes; high-quality built-in test; industrial circuits; industrial design applications; neighborhood pattern generator; performance degradation; probability; stuck-at faults; transition faults; Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit testing; Decoding; Electrical fault detection; Fault detection; Logic testing; Software testing; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2002. Proceedings. International

ISSN

1089-3539

Print_ISBN

0-7803-7542-4

Type

conf

DOI

10.1109/TEST.2002.1041856

Filename

1041856