• DocumentCode
    237862
  • Title

    An improved measurement technique for retrieval of effective constitutive properties of thin dielectric/magnetic and metamaterial samples

  • Author

    Baskey, Himangshu Bhusan ; Akhtar, M.J.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol. Kanpur, Kanpur, India
  • fYear
    2014
  • fDate
    6-6 June 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    An improved partially filled waveguide based technique for the simultaneous measurement of complex permittivity and permeability of thin dielectric-magnetic and metamaterial samples is presented. The proposed approach requires placing a test specimen longitudinally at the centre of a rectangular waveguide cross section for the measurement of scattering coefficient in the specified frequency band. The constitutive properties of the specimen are determined in terms of the measured scattering coefficients using the newly derived expressions, which are based on the solution of the corresponding transcendental equation. The proposed approach is validated by measuring the permittivity and permeability of few standard samples, and comparing the results with the data available in literature. The overall procedure is non-iterative, which makes it quite versatile, and envisages the possibility of even online monitoring of certain parameters.
  • Keywords
    magnetic permeability measurement; metamaterials; permittivity measurement; rectangular waveguides; complex permeability measurement; complex permittivity measurement; effective constitutive properties retrieval; measurement technique; metamaterial samples; partially filled waveguide; rectangular waveguide cross section; scattering coefficient measurement; thin dielectric-magnetic samples; transcendental equation; Dielectric measurement; Frequency measurement; Indexes; Monitoring; Rectangular waveguides; Thickness measurement; Constitutive properties; dielectric and magnetic properties; dielectric measurements; rectangular waveguides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2014 83rd ARFTG
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/ARFTG.2014.6899522
  • Filename
    6899522