Knowledge-based troubleshooting and diagnosis of electronic devices

Author

Vaez-Ghaemi, R.

Author_Institution

Forschungsvorhaben Integrierte Elektrische Messtechnik, Berlin

fYear

1989

fDate

25-27 Apr 1989

Firstpage

299

Lastpage

302

Abstract

The author discusses information acquisition problems in connection with the application of a knowledge-based system for testing and diagnosis of a specific electronic device. The required information is acquired to some extent from CAD/CAE (computer aided design/engineering) data supplied by the design engineer during the development phase. The remaining information is elicited from the designer in a supplementary interview session. After describing the acquisition of graphical data from the CAD/CAE database, the author describes the acquisition of test and diagnostic knowledge and measuring information through the MEXPERT knowledge-based consultant

Keywords

CAD/CAM; automatic testing; electronic engineering computing; electronic equipment testing; fault location; knowledge based systems; CAD/CAE database; MEXPERT knowledge-based consultant; diagnosis; electronic devices; graphical data; information acquisition; knowledge-based system; troubleshooting; Computer graphics; Data engineering; Design automation; Design engineering; Electronic equipment testing; Instruments; Knowledge based systems; Layout; System testing; Wiring;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1989. IMTC-89. Conference Record., 6th IEEE

Conference_Location

Washington, DC

Type

conf

DOI

10.1109/IMTC.1989.36874

Filename

36874