DocumentCode
2384235
Title
Phonon and lattice dynamics in tri-gate FinFETs on (100) and (110) Si substrates
Author
Mukherjee, C. ; Maiti, C.K.
Author_Institution
Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur, India
fYear
2012
fDate
13-16 May 2012
Firstpage
261
Lastpage
264
Abstract
Phonon spectra and lattice dynamics of silicon and other molecular species are studied in detail using inelastic tunneling spectroscopy (IETS) of p-type Al/SiO2/Si tri-gate FinFETs. Phonon and vibration modes are compared for FinFETs on (100) and (110) silicon substrates. The shift in phonon frequencies depending on the direction of current flow, i.e. substrate orientation, has been demonstrated. Major phonons of Si and SiO2 are identified from the IETS spectra of the tri-gate FinFETs.
Keywords
MOSFET; aluminium; phonons; silicon compounds; tunnelling spectroscopy; vibrations; Al-SiO2-Si; IETS spectra; current flow direction; inelastic tunneling spectroscopy; lattice dynamics; molecular species; p-type tri-gate FinFET; phonon dynamics; phonon frequencies; phonon spectra; substrate orientation; vibration modes; FinFETs; Lattices; Phonons; Silicon; Spectroscopy; Tunneling; Vibrations; Tri-gate FinFETs; acoustic and optical phonons; inelastic tunneling spectroscopy; lattice dynamics;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics (MIEL), 2012 28th International Conference on
Conference_Location
Nis
ISSN
pending
Print_ISBN
978-1-4673-0237-1
Type
conf
DOI
10.1109/MIEL.2012.6222849
Filename
6222849
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