DocumentCode
2384646
Title
International intercomparison of silicon density standards
Author
Bettin, H. ; Glaser, M. ; Spieweck, F. ; Toth, H. ; Sacconi, A. ; Peuto, A. ; Fujii, K. ; Tanaka, M. ; Nezu, Y.
Author_Institution
Physikalisch Tech. Bundesanstalt, Braunschweig, Germany
fYear
1996
fDate
17-21 June 1996
Firstpage
161
Lastpage
162
Abstract
In order to obtain a more accurate value for the atomic mass unit u, and thus for the Avogadro constant N/sub A/, the reliability of silicon single crystals´ density values obtained by different measuring techniques was checked by density determinations with four silicon spheres at PTB, IMGC, and NRLM.
Keywords
atomic mass; constants; density measurement; elemental semiconductors; measurement standards; reliability; silicon; units (measurement); Avogadro constant; IMGC; NRLM; PTB; Si; atomic mass unit; density standards; international intercomparison; measuring techniques; reliability; spheres; Argon; Atomic measurements; Crystals; Density measurement; Laboratories; Measurement standards; Measurement uncertainty; Metrology; Silicon; Volume measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location
Braunschweig, Germany
Print_ISBN
0-7803-3376-4
Type
conf
DOI
10.1109/CPEM.1996.546669
Filename
546669
Link To Document