• DocumentCode
    2386039
  • Title

    Table of contents

  • fYear
    2006
  • fDate
    1-4 May 2006
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The following topics are dealt with: leakage reduction; advanced memory device technologies; advanced IC design and integration; advanced transistors; process-induced damage; ultra thin gate dielectric reliability; advanced materials; computer aided design; design for manufacturability; low power IC design; and advanced memory design
  • Keywords
    design for manufacture; dielectric materials; integrated circuit design; integrated memory circuits; leakage currents; logic design; advanced materials; advanced memory design; advanced transistors; computer aided design; design for manufacturability; leakage reduction; low power IC design; memory device; process-induced damage; ultra thin gate dielectric reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on
  • Conference_Location
    Padova
  • Print_ISBN
    1-4244-0097-X
  • Type

    conf

  • DOI
    10.1109/ICICDT.2006.220776
  • Filename
    1669363
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2386039