• DocumentCode
    2387584
  • Title

    EWMA run-to-run controllers with gain updating: Stability and sensitivity analysis

  • Author

    Wang, Jin ; He, Q. Peter

  • Author_Institution
    Dept. of Chem. Eng., Auburn Univ., Auburn, AL
  • fYear
    2008
  • fDate
    11-13 June 2008
  • Firstpage
    2872
  • Lastpage
    2877
  • Abstract
    Exponentially weighted moving average (EWMA) controllers are the most commonly used run-to-run controllers in semiconductor manufacturing. Based on a linear model, an EWMA controller is usually implemented in a way that the process gain is kept as the off-line estimate and the intercept term is updated using an EWMA filter at each run. However, in practice, there are many applications that an EWMA controller is implemented in a way that the process gain is updated in a run-to-run manner while the intercept is kept as the off-line estimate. Although the stability and sensitivity of EWMA controllers with intercept updating has been well known, there is no analysis result on the stability and sensitivity of EWMA controllers with gain updating. In this paper, we analyze the behavior of an EWMA controller with gain updating and compare it to that of an EWMA controller with intercept updating. Both stationary and drifting processes are considered, the expression of the process output are derived and the output variances for stochastic processes are evaluated. In addition, simulation examples are given to illustrate the analysis results.
  • Keywords
    estimation theory; moving average processes; semiconductor device manufacture; sensitivity analysis; stability; EWMA filter; drift process; exponentially weighted moving average run-to-run controller; linear model; offline estimation; semiconductor manufacturing; sensitivity analysis; stability; stationary process; stochastic process; Analytical models; Chemical engineering; Chemical vapor deposition; Etching; Robust control; Robust stability; Sensitivity analysis; Stability analysis; Statistics; Stochastic processes; asymptotic variance; exponentially weighted moving average; sensitivity; stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2008
  • Conference_Location
    Seattle, WA
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-2078-0
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2008.4586930
  • Filename
    4586930