• DocumentCode
    2389209
  • Title

    Performance of surface-mount ceramic and solid tantalum capacitors for cryogenic applications

  • Author

    Hammoud, Ahmad ; Gerber, Scott ; Patterson, Richard L. ; MacDonald, T.L.

  • Author_Institution
    Dynacs Eng. Corp., NASA Lewis Res. Center, Cleveland, OH, USA
  • fYear
    1998
  • fDate
    25-28 Oct 1998
  • Firstpage
    572
  • Abstract
    Low temperature electronics are of great interest for space exploration programs. These include missions to the outer planets, earth-orbiting and deep-space probes, remote-sensing and communication satellites. Terrestrial applications would also benefit from the availability of low temperature electronics. Power components capable of low temperature operation would, thus, enhance the technologies needed for the development of advanced power systems suitable for use in harsh environments. In this work, ceramic and solid tantalum capacitors were evaluated in terms of their dielectric properties as a function of temperature and at various frequencies. The surface-mount devices were characterized in terms of their capacitance stability and dissipation factor in the frequency range of 50 Hz to 100 kHz at temperatures ranging from room temperature (20°C) to about liquid nitrogen temperature (-190°C). The results are discussed and conclusions made concerning the suitability of the capacitors investigated for low temperature applications
  • Keywords
    ceramic capacitors; cryogenic electronics; electrolytic capacitors; space vehicle electronics; surface mount technology; tantalum; 20 to -190 C; 50 Hz to 100 kHz; Ta; capacitance stability; ceramic capacitor; cryogenic applications; dielectric properties; dissipation factor; harsh environment; low temperature electronics; power component; solid tantalum capacitor; space applications; surface mount device; Capacitors; Ceramics; Frequency; Planets; Power system stability; Probes; Remote sensing; Solids; Space exploration; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1998. Annual Report. Conference on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-5035-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.1998.732962
  • Filename
    732962