• DocumentCode
    2392539
  • Title

    Surface reconstruction of polycrystalline TiO2 in oxygen atmosphere

  • Author

    Plugaru, R. ; Vasilco, R. ; Piqueras, J. ; Cremades, A.

  • Author_Institution
    Fac. de Ciencias Fisicas, Univ. Complutense de Madrid, Spain
  • Volume
    2
  • fYear
    2003
  • fDate
    28 Sept.-2 Oct. 2003
  • Abstract
    Polycrystalline TiO2 surface reconstruction in oxygen atmosphere has been investigated by atomic force microscopy (AFM) and cathodoluminescence in the scanning electron microscopy (SEM-CL). The reactivity to oxygen is related to the presence of defects as interstitial Ti ions, that induce growth of protrusions, large terraces and polygonal shaped structures.
  • Keywords
    atomic force microscopy; cathodoluminescence; interstitials; scanning electron microscopy; surface reconstruction; titanium compounds; TiO2; atomic force microscopy; cathodoluminescence; interstitial Ti ions; large terraces; oxygen atmosphere; polycrystalline TiO2; polygonal shaped structures; protrusions; scanning electron microscopy; surface reconstruction; Atmosphere; Atomic force microscopy; Grain boundaries; Infrared spectra; Oxygen; Periodic structures; Scanning electron microscopy; Surface reconstruction; Surface topography; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 2003. CAS 2003. International
  • Print_ISBN
    0-7803-7821-0
  • Type

    conf

  • DOI
    10.1109/SMICND.2003.1252446
  • Filename
    1252446