DocumentCode
2392539
Title
Surface reconstruction of polycrystalline TiO2 in oxygen atmosphere
Author
Plugaru, R. ; Vasilco, R. ; Piqueras, J. ; Cremades, A.
Author_Institution
Fac. de Ciencias Fisicas, Univ. Complutense de Madrid, Spain
Volume
2
fYear
2003
fDate
28 Sept.-2 Oct. 2003
Abstract
Polycrystalline TiO2 surface reconstruction in oxygen atmosphere has been investigated by atomic force microscopy (AFM) and cathodoluminescence in the scanning electron microscopy (SEM-CL). The reactivity to oxygen is related to the presence of defects as interstitial Ti ions, that induce growth of protrusions, large terraces and polygonal shaped structures.
Keywords
atomic force microscopy; cathodoluminescence; interstitials; scanning electron microscopy; surface reconstruction; titanium compounds; TiO2; atomic force microscopy; cathodoluminescence; interstitial Ti ions; large terraces; oxygen atmosphere; polycrystalline TiO2; polygonal shaped structures; protrusions; scanning electron microscopy; surface reconstruction; Atmosphere; Atomic force microscopy; Grain boundaries; Infrared spectra; Oxygen; Periodic structures; Scanning electron microscopy; Surface reconstruction; Surface topography; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2003. CAS 2003. International
Print_ISBN
0-7803-7821-0
Type
conf
DOI
10.1109/SMICND.2003.1252446
Filename
1252446
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