• DocumentCode
    2393835
  • Title

    Skin-effect modeling of image plane techniques for radiated emissions from PCB traces

  • Author

    Moongilan, Dheena

  • Author_Institution
    Lucent Technol., AT&T Bell Labs., Holmdel, NJ, USA
  • fYear
    1997
  • fDate
    18-22 Aug 1997
  • Firstpage
    308
  • Lastpage
    313
  • Abstract
    This paper uses high frequency skin effect models to characterize the current density concentration on PCB traces and then uses image plane techniques to reduce radiated emissions. The signal trace is divided into four rectangular segments based on current density concentrations and radiated emission levels are investigated by placing image planes parallel to each segment. For thick flat parallel conductors of several skin thickness, when the separation between the signal trace and ground plane is very small, the high frequency current flow is within the inner surfaces of signal trace and ground plane and sides of the signal trace. The amount of current flow on the top of the signal trace is very small and the image plane above the signal trace has little effect on radiated emissions. The radiated emission levels are measured for different trace and image plane thickness and separations and results are presented
  • Keywords
    current density; current distribution; electromagnetic interference; microstrip lines; printed circuits; skin effect; PCB traces; current density concentration; current density concentrations; current distribution; current flow; ground plane; high frequency current flow; image plane techniques; inner surfaces; microstrips; radiated emission levels; radiated emissions reduction; rectangular segments; signal trace; skin-effect modeling; thick flat parallel conductors; Circuits; Conductors; Current density; Current distribution; Dielectrics; Frequency; Image segmentation; Microstrip; Skin effect; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1997. IEEE 1997 International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-4140-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.1997.667694
  • Filename
    667694