• DocumentCode
    2395199
  • Title

    Semi-supervised distance metric learning for Collaborative Image Retrieval

  • Author

    Hoi, Steven C H ; Liu, Wei ; Chang, Shih-Fu

  • Author_Institution
    Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Typical content-based image retrieval (CBIR) solutions with regular Euclidean metric usually cannot achieve satisfactory performance due to the semantic gap challenge. Hence, relevance feedback has been adopted as a promising approach to improve the search performance. In this paper, we propose a novel idea of learning with historical relevance feedback log data, and adopt a new paradigm called ldquoCollaborative Image Retrievalrdquo (CIR). To effectively explore the log data, we propose a novel semi-supervised distance metric learning technique, called ldquoLaplacian Regularized Metric Learningrdquo (LRML), for learning robust distance metrics for CIR. Different from previous methods, the proposed LRML method integrates both log data and unlabeled data information through an effective graph regularization framework. We show that reliable metrics can be learned from real log data even they may be noisy and limited at the beginning stage of a CIR system. We conducted extensive evaluation to compare the proposed method with a large number of competing methods, including 2 standard metrics, 3 unsupervised metrics, and 4 supervised metrics with side information.
  • Keywords
    content-based retrieval; graph theory; groupware; image retrieval; learning (artificial intelligence); relevance feedback; Laplacian regularized metric learning; collaborative image retrieval; content-based image retrieval; graph regularization; regular Euclidean metric; relevance feedback; semisupervised distance metric learning; Collaboration; Content based retrieval; Euclidean distance; Extraterrestrial measurements; Feedback; Image retrieval; Information retrieval; Laplace equations; Machine learning; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-2242-5
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2008.4587351
  • Filename
    4587351