DocumentCode
2395199
Title
Semi-supervised distance metric learning for Collaborative Image Retrieval
Author
Hoi, Steven C H ; Liu, Wei ; Chang, Shih-Fu
Author_Institution
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore
fYear
2008
fDate
23-28 June 2008
Firstpage
1
Lastpage
7
Abstract
Typical content-based image retrieval (CBIR) solutions with regular Euclidean metric usually cannot achieve satisfactory performance due to the semantic gap challenge. Hence, relevance feedback has been adopted as a promising approach to improve the search performance. In this paper, we propose a novel idea of learning with historical relevance feedback log data, and adopt a new paradigm called ldquoCollaborative Image Retrievalrdquo (CIR). To effectively explore the log data, we propose a novel semi-supervised distance metric learning technique, called ldquoLaplacian Regularized Metric Learningrdquo (LRML), for learning robust distance metrics for CIR. Different from previous methods, the proposed LRML method integrates both log data and unlabeled data information through an effective graph regularization framework. We show that reliable metrics can be learned from real log data even they may be noisy and limited at the beginning stage of a CIR system. We conducted extensive evaluation to compare the proposed method with a large number of competing methods, including 2 standard metrics, 3 unsupervised metrics, and 4 supervised metrics with side information.
Keywords
content-based retrieval; graph theory; groupware; image retrieval; learning (artificial intelligence); relevance feedback; Laplacian regularized metric learning; collaborative image retrieval; content-based image retrieval; graph regularization; regular Euclidean metric; relevance feedback; semisupervised distance metric learning; Collaboration; Content based retrieval; Euclidean distance; Extraterrestrial measurements; Feedback; Image retrieval; Information retrieval; Laplace equations; Machine learning; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location
Anchorage, AK
ISSN
1063-6919
Print_ISBN
978-1-4244-2242-5
Electronic_ISBN
1063-6919
Type
conf
DOI
10.1109/CVPR.2008.4587351
Filename
4587351
Link To Document