• DocumentCode
    2395290
  • Title

    Semi-Supervised Discriminant Analysis using robust path-based similarity

  • Author

    Zhang, Yu ; Yeung, Dit-Yan

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Linear discriminant analysis (LDA), which works by maximizing the within-class similarity and minimizing the between-class similarity simultaneously, is a popular dimensionality reduction technique in pattern recognition and machine learning. In real-world applications when labeled data are limited, LDA does not work well. Under many situations, however, it is easy to obtain unlabeled data in large quantities. In this paper, we propose a novel dimensionality reduction method, called semi-supervised discriminant analysis (SSDA), which can utilize both labeled and unlabeled data to perform dimensionality reduction in the semi-supervised setting. Our method uses a robust path-based similarity measure to capture the manifold structure of the data and then uses the obtained similarity to maximize the separability between different classes. A kernel extension of the proposed method for nonlinear dimensionality reduction in the semi-supervised setting is also presented. Experiments on face recognition demonstrate the effectiveness of the proposed method.
  • Keywords
    image recognition; learning (artificial intelligence); between-class similarity; dimensionality reduction technique; face recognition; linear discriminant analysis; machine learning; nonlinear dimensionality reduction; pattern recognition; robust path-based similarity; semi-supervised discriminant analysis; within-class similarity; Face recognition; Linear discriminant analysis; Machine learning; Matrices; Noise robustness; Null space; Pattern analysis; Pattern recognition; Scattering; Semisupervised learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-2242-5
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2008.4587357
  • Filename
    4587357