DocumentCode
2395689
Title
Proceedings IEEE International Conference on Wafer Scale Integration (ICWSI)
fYear
1995
fDate
18-20 Jan. 1995
Abstract
The following topics were dealt with: WSI applications; architecture; interconnect and routing; yield and test
Keywords
integrated circuit design; integrated circuit interconnections; integrated circuit testing; integrated circuit yield; network routing; wafer-scale integration; WSI applications; architecture; interconnect; routing; test; wafer scale integration; yield;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Scale Integration, 1995. Proceedings., Seventh Annual IEEE International Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-2467-6
Type
conf
DOI
10.1109/ICWSI.1995.515432
Filename
515432
Link To Document