DocumentCode
2395967
Title
Key parameters for precise lateral displacement estimation in ultrasound elastography
Author
Luo, Jianwen ; Konofagou, Elisa E.
Author_Institution
Dept. of Biomed. Eng., Columbia Univ., New York, NY, USA
fYear
2009
fDate
3-6 Sept. 2009
Firstpage
4407
Lastpage
4410
Abstract
Complementary to axial, lateral and elevational displacement and strain can provide important information on the mechanical properties of biological soft tissues. In this paper, the effects of key parameters on the lateral displacement estimation were investigated in simulations and validated in phantom experiments. The performance of the lateral estimator was evaluated by measuring its associated bias, and jitter (i.e., standard deviation). Simulation results showed that the bias and jitter undergo periodic variations depending on the lateral displacement, with a period equal to the pitch (i.e., adjacent element distance). The performance of the lateral estimation was improved, when a smaller pitch, or a larger beamwidth, was used. The effects of the pitch were found to be greater than those of the beamwidth. The results of the phantom experiments were shown in good agreement with the simulation findings, including the periodic variation of the performance with lateral displacement, effects of pitch and beamwidth. In conclusion, smaller pitches and wider beamwidths were found to be key in reducing the jitter error in the lateral displacement estimation. The same results also hold for tracking in the elevational direction.
Keywords
biological tissues; biomechanics; biomedical ultrasonics; elasticity; jitter; biological soft tissue; jitter error reduction; lateral displacement; lateral displacement estimation; mechanical properties; ultrasound elastography; Beamwidth; Bias; Jitter; Pitch; Ultrasound elastography; Computer Simulation; Elasticity Imaging Techniques; Phantoms, Imaging; Reproducibility of Results;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location
Minneapolis, MN
ISSN
1557-170X
Print_ISBN
978-1-4244-3296-7
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2009.5333692
Filename
5333692
Link To Document