DocumentCode
2398240
Title
Capital equipment reliability
Author
Singh, Amar ; Martin, Ralph
Author_Institution
Mattson Technol. Inc., Sunnyvale, CA, USA
fYear
1991
fDate
21-23 Oct 1991
Firstpage
72
Lastpage
76
Abstract
The authors describe Mattson Technology´s approach to achieving high-reliability levels in semiconductor capital equipment, with MTBFs, (mean time between failures) in the hundreds of hours. Mattson Technology has set a strategic goal to deliver the industry´s most reliable equipment, and an active program is in place to achieve this goal. The basic elements of the program are explained, including equipment design guidelines, supplier selection criteria, life test methods, data gathering and reporting formats, corrective action, change control, equipment user training, and equipment maintenance. The contribution that the equipment user can make in helping his vendor build and maintain reliable equipment is described
Keywords
life testing; maintenance engineering; reliability; semiconductor device manufacture; training; MTBFs; Mattson Technology; change control; corrective action; data gathering; equipment design guidelines; equipment maintenance; equipment user training; life test methods; reliability levels; reliable equipment; semiconductor capital equipment; supplier selection criteria; Communication system control; Costs; Feedback; Guidelines; Life testing; Maintenance; Performance evaluation; Reliability engineering; Throughput; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1991. ASMC 91 Proceedings. IEEE/SEMI 1991
Conference_Location
Boston, MA
Print_ISBN
0-7803-0152-8
Type
conf
DOI
10.1109/ASMC.1991.167387
Filename
167387
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