• DocumentCode
    2398240
  • Title

    Capital equipment reliability

  • Author

    Singh, Amar ; Martin, Ralph

  • Author_Institution
    Mattson Technol. Inc., Sunnyvale, CA, USA
  • fYear
    1991
  • fDate
    21-23 Oct 1991
  • Firstpage
    72
  • Lastpage
    76
  • Abstract
    The authors describe Mattson Technology´s approach to achieving high-reliability levels in semiconductor capital equipment, with MTBFs, (mean time between failures) in the hundreds of hours. Mattson Technology has set a strategic goal to deliver the industry´s most reliable equipment, and an active program is in place to achieve this goal. The basic elements of the program are explained, including equipment design guidelines, supplier selection criteria, life test methods, data gathering and reporting formats, corrective action, change control, equipment user training, and equipment maintenance. The contribution that the equipment user can make in helping his vendor build and maintain reliable equipment is described
  • Keywords
    life testing; maintenance engineering; reliability; semiconductor device manufacture; training; MTBFs; Mattson Technology; change control; corrective action; data gathering; equipment design guidelines; equipment maintenance; equipment user training; life test methods; reliability levels; reliable equipment; semiconductor capital equipment; supplier selection criteria; Communication system control; Costs; Feedback; Guidelines; Life testing; Maintenance; Performance evaluation; Reliability engineering; Throughput; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1991. ASMC 91 Proceedings. IEEE/SEMI 1991
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-0152-8
  • Type

    conf

  • DOI
    10.1109/ASMC.1991.167387
  • Filename
    167387