• DocumentCode
    2399836
  • Title

    Time-resolved emission testing challenges for low voltage CMOS technologies

  • Author

    Song, Peilin ; Stellari, Franco ; Manus, Moyra K Mc

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    2
  • fYear
    2003
  • fDate
    27-28 Oct. 2003
  • Firstpage
    596
  • Abstract
    The advances of CMOS technologies have challenged the time-resolved emission testing and diagnostics of certain applications. This paper addresses these challenges from both emission tooling and chip design perspective.
  • Keywords
    CMOS integrated circuits; integrated circuit design; integrated circuit technology; integrated optoelectronics; superconducting photodetectors; time resolved spectra; CMOS technology; chip design; emission tooling; time-resolved emission diagnostics; time-resolved emission testing; CMOS technology; Detectors; Lenses; Low voltage; Optical filters; Optical imaging; Optical sensors; Space technology; Stimulated emission; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-7888-1
  • Type

    conf

  • DOI
    10.1109/LEOS.2003.1252941
  • Filename
    1252941
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2399836