DocumentCode
2400002
Title
L1-norm and L2-norm neuroimaging methods in reconstructing extended cortical sources from EEG
Author
Ding, Lei
Author_Institution
Univ. of Oklahoma, Norman, OK, USA
fYear
2009
fDate
3-6 Sept. 2009
Firstpage
1922
Lastpage
1925
Abstract
We have previously reported a new sparse neuroimaging method (i.e. VB-SCCD) using the L1-norm optimization technology to solve EEG inverse problems. The new method distinguishes itself from other reported L1-norm methods since it explores the sparseness in a transform domain rather than in the original source domain. In the present study, we conducted a Monte Carlo simulation study to compare the performance of VB-SCCD and other two popular L2-norm neuroimaging methods (i.e. wMNE and cLORETA) in reconstructing extended cortical neural electrical activations. Our simulation data suggests that the VB-SCCD method is able to reconstruct extended cortical sources with the overall high accuracy. It has significantly higher accuracy, less number of false alarms and less number of missing sources when studying complex brain activations (up to 5 simultaneous sources). This new sparse neuroimaging method is thus promising to have many valuable applications in neuroscience and neurology problems. It is also applicable to MEG neuroimaging.
Keywords
Monte Carlo methods; electroencephalography; neurophysiology; L1-norm neuroimaging; L2-norm neuroimaging; Monte Carlo simulation; VB-SCCD method; brain activation; electroencephalography; extended cortical sources reconstructiog; neurology; EEG; L1-norm; SCOP; regularization; sparse neuroimaging; sparseness; transform domain; Algorithms; Area Under Curve; Brain Mapping; Cerebral Cortex; Electroencephalography; Humans; Image Interpretation, Computer-Assisted; Image Processing, Computer-Assisted; Magnetoencephalography; Models, Neurological;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location
Minneapolis, MN
ISSN
1557-170X
Print_ISBN
978-1-4244-3296-7
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2009.5333925
Filename
5333925
Link To Document