DocumentCode
2400690
Title
Measurement of stray capacitance and inductance due to assembly variations in radio frequency circuit boards
Author
Heutmaker, Michael S. ; Fletcher, Linda M. ; Sohn, John E.
fYear
1995
fDate
28-28 April 1995
Abstract
A microstrip directional coupler is used as a test circuit to measure the stray´ capacitance and inductance due to solder flux residue deposits and solder joint geometry variations at frequencies up to 4.8 GHz. The stray capacitance is less than 50 femtofarads, and the absolute value of the stray inductance is less than 100 picohenries.
Keywords
Assembly; Capacitance measurement; Circuit testing; Coupling circuits; Directional couplers; Frequency measurement; Inductance measurement; Microstrip; Parasitic capacitance; Radio frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Sarnoff Symposium, 1995., IEEE Princeton Section
Conference_Location
Princeton, NJ, USA
Type
conf
DOI
10.1109/SARNOF.1995.636712
Filename
636712
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