• DocumentCode
    24014
  • Title

    Ion Beam Features Produced by Two Plasma Focus Machines Operated With Different Gases

  • Author

    Akel, Mohamad ; Alsheikh Salo, Sami ; Sor Heoh Saw ; Sing Lee

  • Author_Institution
    Dept. of Phys., Atomic Energy Comm., Damascus, Syria
  • Volume
    42
  • Issue
    9
  • fYear
    2014
  • fDate
    Sept. 2014
  • Firstpage
    2202
  • Lastpage
    2206
  • Abstract
    Ion beams emitted from the low-inductance kJ NX2 plasma focus have been numerically characterized and trends of these beams in various gases have been reported. In this paper, the ion beams from high-inductance kJ plasma focus machines AECS PF2 and INTI operated with various gases are studied. The obtained results show that the beam ions mean energy depends on the gas type and increases with increasing ion mass of the gas. It also indicates a higher ion fluence for H2 (4.4 × 1020 ions m-2), and a very small fluence value for Xe (0.085 × 1020 ions m-2). The ion number reduces from H2 (24 × 1014) to Xe (0.074 × 1014). The ion current decreases from H2 (20.5% of the discharge current) to 5.4% for Xe. The beam energy drops from H2 (0.63% of stored energy E0) to 0.4% for O2; however, then increases from Ne to the radiatively-collapsed gases Ar, Kr, and Xe. Argon has the highest damage factor (77 × 1010 Wm-2s0.5), while the lightest gases have the lowest (2-6 × 1010 Wm-2s0.5). The magnetic field compressing the pinch is higher for the heavier gases. This paper confirms that the trends of ion beam production with various gases in high-inductance machines are the same as the trends in low-inductance machines.
  • Keywords
    argon; hydrogen; ion beams; krypton; neon; oxygen; pinch effect; plasma diagnostics; plasma diodes; plasma focus; xenon; AECS plasma focus; Ar; H2; INTI plasma focus; Kr; Ne; O2; PF2 plasma focus; Xe; beam energy; beam ions; damage factor; gas type; high- inductance machines; high-inductance kJ plasma focus machines; ion beam features; ion beam production; ion current; ion mass; lightest gases; low-inductance kJ NX2 plasma focus; low-inductance machines; magnetic field; mean energy; pinch; plasma focus machines; radiatively-collapsed gases; Argon; Ion beams; Market research; Plasmas; Xenon; Different gases; Lee model; ion beam; plasma focus;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2014.2342743
  • Filename
    6876200