DocumentCode
2401520
Title
Proceedings First IEEE International Workshop on Electronic Design, Test and Applications ´2002
fYear
2002
fDate
29-31 Jan. 2002
Abstract
The following topics are dealt with: analog design; robotics; submicron technology; FPGA; electromagnetics; sensor design; education; digital signal processing; fault simulation; fault diagnosis; high level design; memory; analog test; communications; test generation; and image processing
Keywords
automatic testing; fault diagnosis; fault simulation; field programmable gate arrays; high level synthesis; image processing; integrated circuit design; integrated circuit technology; robots; sensors; FPGA; analog design; analog test; communications; digital signal processing; electromagnetics; fault diagnosis; fault simulation; high level design; image processing; memory; robotics; sensor design; submicron technology; test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
Conference_Location
Christchurch, New Zealand
Print_ISBN
0-7695-1453-7
Type
conf
DOI
10.1109/DELTA.2002.994578
Filename
994578
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