DocumentCode
2401978
Title
Test socket chip for measuring dark currents in IR FPA
Author
Sheu, Meng Lieh ; Sun, Tai Ping ; Jih, Far-Wen
fYear
2002
fDate
2002
Firstpage
167
Lastpage
171
Abstract
A test socket chip for measuring dark currents of infrared (IR) detectors in a focal plane array (FPA) is presented in this paper. A calibration scheme adopted in this chip to cancel the leakage current due to OFF-state MOS switches tied to the measuring path is also demonstrated
Keywords
calibration; dark conductivity; focal planes; infrared detectors; leakage currents; IR FPA; OFF-state MOS switches; calibration scheme; dark currents; infrared detectors; leakage current; measuring path; test socket chip; Calibration; Current measurement; Dark current; Infrared detectors; Leakage current; Semiconductor device measurement; Sensor arrays; Sockets; Switches; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
Conference_Location
Christchurch
Print_ISBN
0-7695-1453-7
Type
conf
DOI
10.1109/DELTA.2002.994608
Filename
994608
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