• DocumentCode
    2402060
  • Title

    Surface Topography and Mixed Pixel Effects on the Simulated L-band Brightness Temperatures

  • Author

    Talone, M. ; Camps, A. ; Monerris, A. ; Vall-llossera, M. ; Piles, Maria ; Ferrazzoli, P.

  • Author_Institution
    Dept. of Signal Theory & Commun., Univ. Politecnica de Catalunya, Barcelona
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    181
  • Lastpage
    186
  • Abstract
    The impact of topography and mixed pixels on L-band radiometric observations over land has not been properly quantified so far. With this purpose, simulations have been performed with an upgraded version of the Soil Moisture and Ocean Salinity (SMOS) End-to-end Performance Simulator (SEPS). The brightness temperature (TB) generator of SEPS has been improved to include a 100 m-resolution land cover map (21 uses) and a 30 m-resolution digital elevation map of the Catalonian Region (NE Spain). The high resolution TB generator allows to assess the errors in the soil moisture retrieval algorithms due to limited spatial resolution, and to set the basis for the development of pixel disaggregation techniques. Variation of the local incidence angle as seen from SMOS, shadowing, and atmospheric effects (up- and down-welling radiation) due to surface topography have been analyzed. Results are compared to TB values computed under the assumption of an ellipsoidal Earth
  • Keywords
    microwave measurement; radiometry; soil; topography (Earth); Catalonian region; L-band brightness temperatures; NE Spain; SEPS; SMOS; Soil Moisture and Ocean Salinity End-to-end Performance Simulator; brightness temperature generator; digital elevation map; land cover map; local incidence angle; mixed pixel effects; pixel disaggregation techniques; soil moisture retrieval algorithms; surface topography; Brightness temperature; L-band; Ocean temperature; Radiometry; SMOS mission; Sea surface; Shadow mapping; Soil moisture; Spatial resolution; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE MicroRad, 2006
  • Conference_Location
    SanJuan
  • Print_ISBN
    0-7803-9417-8
  • Type

    conf

  • DOI
    10.1109/MICRAD.2006.1677085
  • Filename
    1677085