Polarimetric wavelet phenomenology of space materials

Author

Giakos, G.C. ; Picard, R.H. ; Dao, P.D. ; Crabtree, P.N. ; McNicholl, P.J.

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Akron, Akron, OH, USA

fYear

2011

fDate

17-18 May 2011

Firstpage

1

Lastpage

6

Abstract

This paper describes new polarimetric wavelet detection principles applied to the backscattering characteristics of space materials in the near infrared. Efficient polarimetric detection techniques are combined with cross-correlation and wavelet analysis for enhanced characterization of space materials. The outcome of this study will support remote characterization of space materials and structures with enhanced discrimination, localization, and high-dynamic range while maintaining uncompromised sensitivity.

Keywords

aerospace materials; backscatter; correlation methods; polarimetry; wavelet transforms; backscattering characteristics; cross-correlation; near infrared; polarimetric detection; polarimetric wavelet detection; space materials; uncompromised sensitivity; wavelet analysis; Amorphous silicon; Correlation; Matrix decomposition; Photovoltaic cells; Wavelet analysis; Wavelet transforms; Polarimetry; Remote Sensing; Space Materials; Wavelet Analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Imaging Systems and Techniques (IST), 2011 IEEE International Conference on

Conference_Location

Penang

Print_ISBN

978-1-61284-894-5

Type

conf

DOI

10.1109/IST.2011.5962233

Filename

5962233