DocumentCode
2403872
Title
A Comparison of DC and Transient Response Tests for Analogue Circuits
Author
Taylor, D. ; Evans, P.S.A. ; Pritchard, T.I.
Author_Institution
Sch. of Eng., Polytech. of Huddersfield, Huddersfield, UK
fYear
1992
fDate
21-23 Sept. 1992
Firstpage
119
Lastpage
122
Abstract
Transient Response Analysis [1] (TRA) is a quick and inexpensive method of testing analogue circuitry. In this paper we compare the effectiveness of traditional DC testing of analogue circuit cells with dynamic tests, using a simple analogue subcircuit element which models one component of a large mixed-signal ASIC.
Keywords
analogue circuits; mixed analogue-digital integrated circuits; transient response; analogue circuit cells; analogue circuit testing; analogue subcircuit element; mixed-signal ASIC; traditional DC testing; transient response analysis; Analog computers; Application specific integrated circuits; Circuit testing; Controllability; Integrated circuit testing; Operational amplifiers; Registers; System testing; Transient analysis; Transient response;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1992. ESSCIRC '92. Eighteenth European
Conference_Location
Copenhagen
Print_ISBN
87-984232-0-7
Type
conf
DOI
10.1109/ESSCIRC.1992.5468407
Filename
5468407
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