DocumentCode
2405650
Title
2002 IEEE International SOI Conference. Proceedings (Cat. No.02CH37347)
fYear
2002
fDate
7-10 Oct. 2002
Keywords
MOS analogue integrated circuits; MOS integrated circuits; elemental semiconductors; integrated circuit modelling; integrated circuit reliability; mixed analogue-digital integrated circuits; semiconductor device reliability; silicon; silicon-on-insulator; RF circuits; SOI circuits; SOI devices; SOI materials processing; Si-SiO/sub 2/; analog circuits; circuit techniques; mixed mode circuits; modelling; reliability; simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, IEEE International 2002
Conference_Location
Williamsburg, VA, USA
Print_ISBN
0-7803-7439-8
Type
conf
DOI
10.1109/SOI.2002.1044395
Filename
1044395
Link To Document