DocumentCode
2406837
Title
Reduction of hysteretic propagation delay with less performance degradation by novel body contact in PD SOI application
Author
Min, B.W. ; Kang, L. ; Wu, D. ; Caffo, D. ; Hayden, J. ; Mendicino, M.A.
Author_Institution
Digital DNA Labs., Motorola Inc., Austin, TX, USA
fYear
2002
fDate
7-10 Oct 2002
Firstpage
169
Lastpage
170
Abstract
A novel body contacted PDSOI MOSFET with double gate oxide integration at the body contact region is successfully demonstrated. It suppresses floating body effects without adding substantial gate loading capacitance in the body contact region, thus minimizing circuit performance degradation from the body contact region.
Keywords
MOSFET; silicon-on-insulator; body contacted PDSOI MOSFET; circuit performance degradation; double gate oxide integration; floating body effects; hysteretic propagation delay; partially depleted SOI; MOSFETs; Silicon on insulator technology;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, IEEE International 2002
Print_ISBN
0-7803-7439-8
Type
conf
DOI
10.1109/SOI.2002.1044462
Filename
1044462
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