• DocumentCode
    2406837
  • Title

    Reduction of hysteretic propagation delay with less performance degradation by novel body contact in PD SOI application

  • Author

    Min, B.W. ; Kang, L. ; Wu, D. ; Caffo, D. ; Hayden, J. ; Mendicino, M.A.

  • Author_Institution
    Digital DNA Labs., Motorola Inc., Austin, TX, USA
  • fYear
    2002
  • fDate
    7-10 Oct 2002
  • Firstpage
    169
  • Lastpage
    170
  • Abstract
    A novel body contacted PDSOI MOSFET with double gate oxide integration at the body contact region is successfully demonstrated. It suppresses floating body effects without adding substantial gate loading capacitance in the body contact region, thus minimizing circuit performance degradation from the body contact region.
  • Keywords
    MOSFET; silicon-on-insulator; body contacted PDSOI MOSFET; circuit performance degradation; double gate oxide integration; floating body effects; hysteretic propagation delay; partially depleted SOI; MOSFETs; Silicon on insulator technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, IEEE International 2002
  • Print_ISBN
    0-7803-7439-8
  • Type

    conf

  • DOI
    10.1109/SOI.2002.1044462
  • Filename
    1044462