DocumentCode

2408955

Title

Semiconductor challenges

Author

Cuomo, Andrea

fYear

2003

fDate

2003

Firstpage

8

Lastpage

8

Keywords

Europe; Integrated circuit technology; Photonics; Secure storage; Security; Technological innovation; Technology management; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe Conference and Exhibition, 2003

ISSN

1530-1591

Print_ISBN

0-7695-1870-2

Type

conf

DOI

10.1109/DATE.2003.1253579

Filename

1253579