DocumentCode
2410123
Title
Introspection in system-level language frameworks: meta-level vs. integrated
Author
Doucet, Frederic ; Shukla, Sandeep ; Gupta, Rajesh
Author_Institution
California Univ., Irvine, CA, USA
fYear
2003
fDate
2003
Firstpage
382
Lastpage
387
Abstract
Reflection and automated introspection of a design in system level design frameworks are seen as necessities for the CAD tools to manipulate the designs within the tools. These features are also useful for debuggers, class and object browsers, design analyzers, composition validation, type checking, compatibility checking, etc. However the central question is whether such features should be integrated into the language, or if we should build frameworks which feature these capabilities in a meta-layer leaving the system-level language intact. In our recent interactions with designers, we have found differing opinions. Especially in the context of SystemC, the temptation to integrate reflective APIs into the language is great, because C++ is expressive, and already has type introspective packages available. In this paper, we analyze this issue and show that (i) it is a better EDA system architecture to implement reflection/introspection at a meta-layer in a design framework (it) there are relatively unexplored territories of design automation, such as behavioral typing of component interfaces, corresponding type-theory, and their implication in automating component composition, interface synthesis, and validation, which can be better incorporated if the introspection is implemented at a meta-layer.
Keywords
hardware description languages; C++ language; CAD tool; SystemC language; electronic design automation; integrated introspection; meta-level introspection; reflective API; system-level language; Computer languages; Design automation; Displays; Electronic design automation and methodology; Hardware design languages; Intellectual property; Libraries; Packaging; Reflection; System-level design;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN
1530-1591
Print_ISBN
0-7695-1870-2
Type
conf
DOI
10.1109/DATE.2003.1253638
Filename
1253638
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