DocumentCode
2410490
Title
2005 IEEE Radiation Effects Data Workshop (IEEE Cat. No. 05TH8835)
fYear
2005
fDate
11-15 July 2005
Abstract
The following topics are dealt with: total ionizing dose; displacement damage and single particle effects on a large number of electronic devices, integrated circuits and detectors; hardness-by-design methodologies and environments and facilities.
Keywords
integrated circuit testing; radiation effects; radiation hardening (electronics); detector devices; displacement damage; electronic devices; hardness-by-design methodologies; integrated circuits; radiation effects; single particle effects; total ionizing dose;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2005. IEEE
Conference_Location
Seattle, WA
Print_ISBN
0-7803-9367-8
Type
conf
DOI
10.1109/REDW.2005.1532652
Filename
1532652
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