• DocumentCode
    2410846
  • Title

    SEE and TID results for a commercially fabricated radiation-hardened clock generator circuit

  • Author

    Hafer, C. ; Schnathorst, V. ; Pfeil, J. ; Meade, T. ; Farris, T. ; Jordan, A.

  • Author_Institution
    Aeroflex Colorado Springs, CO, USA
  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    93
  • Lastpage
    97
  • Abstract
    A RadHard-by-design, PLL-based, single chip, clock network and clock generator solution has been designed, manufactured and tested. Hardness test results for the Aeroflex Colorado Springs RadClock™ clock generator circuit designed for harsh space environment applications are presented.
  • Keywords
    CMOS digital integrated circuits; clocks; integrated circuit testing; phase locked loops; radiation effects; RadClock clock generator circuit; RadHard-by-design clock generator; harsh space environment; radiation-hardened clock generator circuit; single chip PLL-based clock generator; single chip PLL-based clock network; CMOS process; Circuit testing; Clocks; Flip-flops; Frequency; Jitter; Manufacturing; Monolithic integrated circuits; Phase locked loops; Springs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2005. IEEE
  • Print_ISBN
    0-7803-9367-8
  • Type

    conf

  • DOI
    10.1109/REDW.2005.1532672
  • Filename
    1532672
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2410846