DocumentCode
2413661
Title
Embedded Test Features for High-Speed Serial I/O
Author
Rearick, Jeff
Author_Institution
Mile High Design Center, Fort Collins
fYear
2007
fDate
16-19 Sept. 2007
Firstpage
153
Lastpage
156
Abstract
High-speed serial I/O interfaces are becoming ubiquitous, yet remain very challenging to test effectively and efficiently (or even at all) during high volume production. The use of on-chip test and measurement circuitry to assist or replace external equipment is an emerging paradigm to address the issue. A brief survey of these embedded test features and their optimization for HVM support, plus an overview of the activity of the IEEE P1687 working group, is presented.
Keywords
application specific integrated circuits; computer interfaces; embedded systems; input-output programs; embedded test features; high speed serial I/O interfaces; measurement circuitry; on chip test; Circuit testing; Counting circuits; Design for testability; Instruments; Laboratories; Life testing; Manufacturing processes; Pins; Production; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-1623-3
Electronic_ISBN
978-1-4244-1623-3
Type
conf
DOI
10.1109/CICC.2007.4405702
Filename
4405702
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