Full-wave embedding — De-embedding procedures for RFID measurement space characterization

In the current work, full-wave assisted embedding/ de-embedding procedures for the measurement space characterization of small radiating systems, are contributed. The problem, of poor match between analysis and measurement results, poor match among results of different methods or methods using different fixtures, is well known but not well understood since due to small electrical size of the devices under test various issues arise. To address those problems, we contribute the concept of full-wave assisted embedding/ de-embedding accompanied by calibration procedures based on generalized error correction models.