• DocumentCode
    241589
  • Title

    Basic properties of electrolyte-oxide-semiconductor structures with applications in biochemical sensing

  • Author

    Hao Wang ; Jianguang Gao ; Zhuojie Chen ; Wengang Wu

  • Author_Institution
    Shenzhen Grad. Sch., Peking Univ., Shenzhen, China
  • fYear
    2014
  • fDate
    28-31 Oct. 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    We present the basic properties and potential applications of a kind of electrolyte-oxide-semiconductor (EOS) structure, which is composed of a Si layer, a SiO2 layer, and an electrolyte solution layer, from bottom to top. It is demonstrated that the EOS structures exhibit a stable one-way electrical conductivity like a diode, and there is a threshold voltage in the ON-switching process. Moreover, it is found that the thicknesses of SiO2 layers and the concentrations of electrolyte solutions affect the current density obviously. A conductive-filament model is proposed to analyze the conductivity mechanism of EOS structures. The EOS structures can be used for many biochemical applications. We have realized copper-ion detection and pH sensing by utilizing their basic characteristics.
  • Keywords
    biochemistry; biological techniques; copper; electrical conductivity; electrochemical sensors; electrolytes; pH measurement; positive ions; semiconductors; silicon; silicon compounds; Cu2+; EOS structure composition; ON-switching process; Si; Si layer; SiO2; SiO2 layer thickness effect; biochemical sensing applications; conductive-filament model; conductivity mechanism analysis; copper-ion detection; current density; diode; electrolyte solution concentration effect; electrolyte solution layer; electrolyte-oxide-semiconductor structure properties; one-way electrical conductivity; pH sensing; threshold voltage; Abstracts; Artificial intelligence; Earth Observing System; Films; Switches; Thickness measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4799-3296-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2014.7021217
  • Filename
    7021217