DocumentCode
2416647
Title
2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602)
fYear
2001
fDate
21-21 Oct. 2001
Keywords
III-V semiconductors; gallium arsenide; reliability; GaAs; GaAs reliability; HBT; defects; field-accelerated testing; temperature-accelerated testing;
fLanguage
English
Publisher
ieee
Conference_Titel
GaAs Reliability Workshop, 2001. Proceedings
Conference_Location
Baltimore, MD, USA
Print_ISBN
0-7908-0066-7
Type
conf
DOI
10.1109/GAASRW.2001.995722
Filename
995722
Link To Document