• DocumentCode
    2418116
  • Title

    On relative gain array and condition number

  • Author

    Chen, Jie ; Freudenberg, James S. ; Nett, Carl N.

  • Author_Institution
    Sch. of Aerosp. & Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1992
  • fDate
    1992
  • Firstpage
    219
  • Abstract
    Deviations of open-loop properties in the presence of modeling uncertainties are studied. The aim is to gain insights into how open-loop properties and, thus, potentially closed-loop properties may vary in the face of a diagonally structured uncertainty. Several estimates are given for the worst-case deviations of the open-loop transfer function in terms of the scaled plant condition numbers, the relative gain array, and the block relative gains. The worst-case deviation will be largely exactly when the estimates stated in terms of the condition number are large. An example is constructed to show that the relative gain array and block relative gains may be optimistic measures in assessing these deviations. The developments here support previous conjectures and results which assert that plants with large condition numbers and/or relative gains are potentially difficult to control
  • Keywords
    control system analysis; matrix algebra; transfer functions; condition number; open-loop properties; relative gain array; transfer function; uncertainty modelling; worst-case deviations; Aerospace engineering; Electrical equipment industry; Face detection; Gain measurement; Process control; Robust control; Robustness; State estimation; Transfer functions; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1992., Proceedings of the 31st IEEE Conference on
  • Conference_Location
    Tucson, AZ
  • Print_ISBN
    0-7803-0872-7
  • Type

    conf

  • DOI
    10.1109/CDC.1992.371751
  • Filename
    371751