DocumentCode
2418116
Title
On relative gain array and condition number
Author
Chen, Jie ; Freudenberg, James S. ; Nett, Carl N.
Author_Institution
Sch. of Aerosp. & Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
1992
fDate
1992
Firstpage
219
Abstract
Deviations of open-loop properties in the presence of modeling uncertainties are studied. The aim is to gain insights into how open-loop properties and, thus, potentially closed-loop properties may vary in the face of a diagonally structured uncertainty. Several estimates are given for the worst-case deviations of the open-loop transfer function in terms of the scaled plant condition numbers, the relative gain array, and the block relative gains. The worst-case deviation will be largely exactly when the estimates stated in terms of the condition number are large. An example is constructed to show that the relative gain array and block relative gains may be optimistic measures in assessing these deviations. The developments here support previous conjectures and results which assert that plants with large condition numbers and/or relative gains are potentially difficult to control
Keywords
control system analysis; matrix algebra; transfer functions; condition number; open-loop properties; relative gain array; transfer function; uncertainty modelling; worst-case deviations; Aerospace engineering; Electrical equipment industry; Face detection; Gain measurement; Process control; Robust control; Robustness; State estimation; Transfer functions; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 1992., Proceedings of the 31st IEEE Conference on
Conference_Location
Tucson, AZ
Print_ISBN
0-7803-0872-7
Type
conf
DOI
10.1109/CDC.1992.371751
Filename
371751
Link To Document