• DocumentCode
    2418498
  • Title

    Emotion recognition using LP residual

  • Author

    Chauhan, Arun ; Koolagudi, Shashidhar G. ; Kafley, Sabin ; Rao, K. Sreenivasa

  • Author_Institution
    Sch. of Inf. Technol., Indian Inst. of Technol. Kharagpur, Kharagpur, India
  • fYear
    2010
  • fDate
    3-4 April 2010
  • Firstpage
    255
  • Lastpage
    261
  • Abstract
    This paper explores the Linear Prediction (LP) residual of speech signal for characterizing the basic emotions. The emotions used in this study are anger, compassion, disgust, fear, happy, neutral, sarcastic and surprise. LP residual is derived by inverse filtering of the speech signal, and the process is known as LP analysis. LP residual mainly contains higher order relations among the samples. For capturing the emotion specific information from these higher order relations, autoassociative neural network (AANN) and Gaussian mixture models (GMM) are used. The decrease in the error during training phase of the AANN´s and the emotion recognition performance of the models, demonstrate that the excitation source component of speech contains emotion-specific information and is indeed being captured by the AANN and GMM models. IITKGP-Simulated Emotion Speech Corpus (IITKGP-SESC) is used as a database, for characterization and classification of emotions. The emotion recognition performance is observed to be about 56%.
  • Keywords
    Gaussian processes; emotion recognition; neural nets; speech processing; Gaussian mixture models; IITKGP simulated emotion speech corpus; autoassociative neural network; emotion recognition; emotion specific information; inverse filtering; linear prediction residual; speech signal; Emotion recognition; Emotion recognition; Emotion-specific information; Excitation source; IITKGP-SESC; LP Residual;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Students' Technology Symposium (TechSym), 2010 IEEE
  • Conference_Location
    Kharagpur
  • Print_ISBN
    978-1-4244-5975-9
  • Electronic_ISBN
    978-1-4244-5974-2
  • Type

    conf

  • DOI
    10.1109/TECHSYM.2010.5469162
  • Filename
    5469162