DocumentCode
2418793
Title
Deposition and Characterization of Layer-by-Layer Nano Self-Assembled Carbon Nanotube Multilayer Thin Films
Author
Xue, Wei ; Cui, Tianhong
Author_Institution
Dept. of Mech. Eng., Minnesota Univ., Minneapolis, MN
fYear
2007
fDate
16-19 Jan. 2007
Firstpage
371
Lastpage
376
Abstract
We present a simple, effective, and accurate method to grow single-walled carbon nanotube (SWNT) multilayer thin films with layer-by-layer (LbL) nano self-assembly. The thin film is assembled on the substrate by alternate adsorption of SWNTs and poly (dimethyldiallylammonium chloride) (PDDA). Scanning electron microscope (SEM) inspection shows that the SWNT multilayer is formed with a dense network of nanotube bundles. The average thickness of a single (PDDA/SWNT) bi-layer is measured as 76 Aring. The volume and mass ratios of SWNTs in the multilayer are calculated as 63.2% and 75%, respectively. With nanoindentation measurement, the Young´s modulus of the SWNT thin film is approximately 17 GPa. The electro-thermal properties of the SWNT multilayer are studied with current-voltage (I-V), four-point probe, and rapid thermal annealing (RTA) techniques. The conductance of the SWNT thin film at 300degC is measured as 2.29 mS, which is 50 times higher than that at room temperature (0.045 mS).
Keywords
carbon nanotubes; multilayers; rapid thermal annealing; scanning electron microscopes; self-assembly; thin films; 2.29 ms; 300 C; Young modulus; electro-thermal properties; layer-by-layer nano self-assembled carbon nanotube multilayer thin films; layer-by-layer nano self-assembly; nanoindentation measurement; rapid thermal annealing techniques; scanning electron microscope; single-walled carbon nanotube multilayer thin films; Assembly; Carbon nanotubes; Inspection; Nonhomogeneous media; Scanning electron microscopy; Self-assembly; Sputtering; Substrates; Thickness measurement; Transistors; Carbon nanotubes (CNTs); characterization; layer-by-layer (LbL) nano self-assembly; multilayer;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
Conference_Location
Bangkok
Print_ISBN
1-4244-0610-2
Type
conf
DOI
10.1109/NEMS.2007.352038
Filename
4160341
Link To Document