• DocumentCode
    2420442
  • Title

    Fault detection and classification with DNA chips

  • Author

    Delgado, Alberto

  • Author_Institution
    Electr. & Electron. Eng. Dept., Nat. Univ. of Colombia, Bogota, Colombia
  • fYear
    2003
  • fDate
    8-8 Oct. 2003
  • Firstpage
    685
  • Lastpage
    690
  • Abstract
    DNA chips are currently used for gene expression studies of cells and tissues under different conditions. The same principle can be applied in control engineering to supervise industrial plants, determine operating conditions, detect or classify faults using thousands of sampled analog or binary variables.
  • Keywords
    biocomputing; control engineering computing; fault diagnosis; industrial plants; DNA chips; control engineering; deoxyribonucleic acid; fault classification; fault detection; gene expression studies; industrial plants; operating conditions; sampled analog variables; sampled binary variables;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control. 2003 IEEE International Symposium on
  • Conference_Location
    Houston, TX, USA
  • ISSN
    2158-9860
  • Print_ISBN
    0-7803-7891-1
  • Type

    conf

  • DOI
    10.1109/ISIC.2003.1254718
  • Filename
    1254718
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2420442