A 0.885ppm/°C digitally calibrated bandgap voltage reference with robust start-up circuit

Author

Ji He ; Long Zhao ; Yuhua Cheng

Author_Institution

Shanghai Res. Inst. of Microelectron., Peking Univ., Shanghai, China

fYear

2014

fDate

28-31 Oct. 2014

Firstpage

1

Lastpage

3

Abstract

A low-voltage, low temperature coefficient (TC) bandgap voltage reference (BGR) with robust start-up circuit is designed using a standard CMOS 0.18μm process. The TC is adjusted by a digitally-controlled calibration scheme. A novel and robust start-up circuit is proposed for both successful start-up behavior and TC calibration according to the operation state of the BGR. The simulation results show that a reference voltage of 604mV is obtained with a quite low TC of 0.885ppm/°C, while its power consumption is only 303μW under 1.8V supply voltage.

Keywords

CMOS integrated circuits; calibration; digital control; reference circuits; TC BGR; digitally calibrated bandgap voltage reference; digitally-controlled calibration scheme; low-voltage low temperature coefficient; power 303 muW; robust start-up circuit; size 0.18 mum; standard CMOS process; voltage 1.8 V; voltage 604 mV; Abstracts; BiCMOS integrated circuits; CMOS integrated circuits; CMOS technology; Photonic band gap; Robustness;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on

Conference_Location

Guilin

Print_ISBN

978-1-4799-3296-2

Type

conf

DOI

10.1109/ICSICT.2014.7021552

Filename

7021552